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首页> 外文期刊>Applied optics >Improved differential confocal microscopy with ultrahigh signal-to-noise ratio and reflectance disturbance resistibility
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Improved differential confocal microscopy with ultrahigh signal-to-noise ratio and reflectance disturbance resistibility

机译：改进的差分共聚焦显微镜，具有超高的信噪比和反射率抗干扰性

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摘要

Improved differential confocal microscopy is proposed to improve axial resolution and to enhance disturbance resistibility of confocal microscopy. The subtraction and sum values of the two defocusing detected signals are divided as the response function. Both ultrahigh signal-to-noise ratio (SNR) and wide range can be selectively obtained by controlling the defocusing amount of the two differential detectors more tightly with the reflectance disturbance resistibility. Since the detecting sensitivity of the proposed confocal microscopy is unrelated to the energy loss of the reflected beam, the multiplicative mode disturbance can be used to measure microstructures made of hybrid materials and overcome the power drift of a laser source during long scanning. In the case of ultrahigh SNR, the axial resolution reaches 1 nm when NA velence 0.75 and lambda velence 632.8 nm.
机译：提出了改进的差动共聚焦显微镜以提高轴向分辨率并增强共聚焦显微镜的抗干扰性。将两个散焦检测信号的减和和值相除作为响应函数。通过以反射率抗干扰性更严格地控​​制两个差分检测器的散焦量，可以有选择地获得超高信噪比（SNR）和宽范围。由于所提出的共聚焦显微镜的检测灵敏度与反射光束的能量损耗无关，因此倍增模式干扰可用于测量由混合材料制成的微结构，并克服了长时间扫描过程中激光源的功率漂移。在超高SNR的情况下，当NA velence 0.75和lambda velence 632.8 nm时，轴向分辨率达到1 nm。

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