General approach to reliable characterization of thin metal films

Tatiana V. Amotchkina; Vesna Janicki; Jordi Sancho-Parramon; Alexander V. Tikhonravov; Michael K. Trubetskov; Hrvoje Zorc

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General approach to reliable characterization of thin metal films

机译：可靠表征金属薄膜的一般方法

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Optical constants of thin metal films are strongly dependent on deposition conditions, growth mode, and thickness. We propose a universal characterization approach that allows reliable determination of thin metal film optical constants as functions of wavelength and thickness. We apply this approach to determination of refractive index dispersion of silver island films embedded between silica layers.

机译：金属薄膜的光学常数在很大程度上取决于沉积条件，生长模式和厚度。我们提出了一种通用的表征方法，该方法允许可靠地确定金属薄膜光学常数随波长和厚度的变化。我们将这种方法用于确定嵌入在二氧化硅层之间的银岛薄膜的折射率色散。

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《Applied optics》 |2011年第10期|共12页
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Tatiana V. Amotchkina; Vesna Janicki; Jordi Sancho-Parramon; Alexander V. Tikhonravov; Michael K. Trubetskov; Hrvoje Zorc;
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1. General approach to reliable characterization of thin metal films [J] . Tatiana V. Amotchkina, Vesna Janicki, Jordi Sancho-Parramon, Applied optics . 2011,第10期

机译：可靠表征金属薄膜的一般方法
2. Comparison of two techniques for reliable characterization of thin metal-dielectric films [J] . Tatiana V. Amotchkina, Michael K. Trubetskov, Alexander V. Tikhonravov, Applied optics . 2011,第33期

机译：两种可靠表征金属介电薄膜的技术的比较
3. Modified approach for high frequency dielectric characterization of thinly metallized soft polymer film using grounded coplanar waveguide [J] . Samuel Baron, Kevin Nadaud, Benoit Guiffard, Applied Physics Letters . 2015,第9期

机译：使用接地共面波导的薄金属化软聚合物薄膜高频介电特性的改进方法
4. Conjugated polymer network ultrathin films on metal interfaces using the precursor polymer approach:design,synthesis and in-situ characterization [C] . Rigoberto Advincula, Chuanjun Xia, Prasad Taranekar, Materials Research Society Symposium . 2003

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5. Synthesis and characterization of amidate, carbohydrazide, and amidrazonate complexes of group 4 and first row transition metals as potential precursors for Atomic Layer Deposition of metal and metal oxide thin films [D] . Karunarathne, Mahesh Chinthaka 2010

机译：4族和第一行过渡金属的酰胺酸盐，碳酰肼和酰胺氮杂酸盐配合物的合成和表征，作为金属和金属氧化物薄膜原子层沉积的潜在前体
6. Optical characterizations of PMMA/metal oxide nanoparticles thin films: bandgap engineering using a novel derived model [O] . Qais M. Al-Bataineh, Ahmad.A. Ahmad, A.M. Alsaad, 2021

机译：PMMA /金属氧化物纳米颗粒薄膜的光学表征：使用新型衍生模型的带隙工程
7. General approach to reliable characterization of thin metal films [O] . Amotchkina Tatiana, Janicki Vesna, Sancho-Parramon Jordi, 2011

机译：可靠表征金属薄膜的一般方法

General approach to reliable characterization of thin metal films

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