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Group delay dispersion measurement of a dispersive mirror by spectral interferometry: comparison of different signal processing algorithms

机译:通过光谱干涉法测量色散镜的群时延色散:比较不同信号处理算法

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摘要

We built a dispersive white-light spectral interferometer for precisely measuring the dispersion properties of a multilayer thin-film structure. A novel algorithm with improved robustness to measurement errors is presented by combining a windowed Fourier transformation with wavelet-based differentiation. Compared with previously published algorithms, this method shows substantial resistance to measurement errors. The group delay dispersion properties of bulk materials and a homemade chirped mirror are measured by our apparatus, and the measurement result manifests considerable accuracy and robustness. The technique shows reasonable potential for the characterization of ultrabroadband chirped mirrors.
机译:我们建立了一个色散白光光谱干涉仪,用于精确测量多层薄膜结构的色散特性。通过将窗口傅里叶变换与基于小波的微分相结合,提出了一种对测量误差具有更高鲁棒性的新颖算法。与以前发布的算法相比,此方法显示出对测量误差的抵抗力。用我们的仪器测量了散装材料和自制chi镜的群延迟色散特性,测量结果显示出相当高的准确性和鲁棒性。该技术显示出表征超宽带chi反射镜的合理潜力。

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