• 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>Applied optics >CCD camera response to diffraction patterns simulating particle images
【24h】

CCD camera response to diffraction patterns simulating particle images

机译：CCD照相机对模拟颗粒图像的衍射图样的响应

获取原文
获取原文并翻译 | 示例
           
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

We present a statistical study of CCD (or CMOS) camera response to small images. Diffraction patterns simulating particle images of a size around 2-3 pixels were experimentally generated and characterized using three-point Gaussian peak fitting, currently used in particle image velocimetry (PIV) for accurate location estimation. Based on this peak-fitting technique, the bias and RMS error between locations of simulated and real images were accurately calculated by using a homemade program. The influence of the intensity variation of the simulated particle images on the response of the CCD camera was studied. The experimental results show that the accuracy of the position determination is very good and brings attention to superresolution PIV algorithms. Some tracks are proposed in the conclusion to enlarge and improve the study.
机译：我们对CCD（或CMOS）相机对小图像的响应进行了统计研究。实验产生了模拟大小在2-3个像素左右的粒子图像的衍射图，并使用三点高斯峰拟合进行了表征，该算法目前用于粒子图像测速（PIV）中，用于精确的位置估计。基于此峰值拟合技术，使用自制程序可以精确计算模拟图像和真实图像之间的偏差和RMS误差。研究了模拟粒子图像强度变化对CCD相机响应的影响。实验结果表明，位置确定的精度非常好，引起了人们对超分辨率PIV算法的关注。结论中提出了一些途径，以扩大和改进研究。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号