首页> 外文期刊>Applied optics >Soft x-ray free-electron laser imaging by LiF crystal and film detectors over a wide range of fluences
【24h】

Soft x-ray free-electron laser imaging by LiF crystal and film detectors over a wide range of fluences

机译:通过LiF晶体和薄膜探测器在宽范围内进行软X射线自由电子激光成像

获取原文
获取原文并翻译 | 示例
           

摘要

LiF crystal and film detectors were used to measure the far-field fluence profile of a self-amplified spontaneous-emission free-electron laser beam and diffraction imaging with high spatial resolution. In these measurements the photoluminescence (PL) response of LiF crystal and film was compared over a wide range of soft x-ray fluences. It was found that the soft x-ray fluence dependences of LiF crystal and film differ. At low fluence, the LiF crystal shows higher PL response compared to LiF film, while this comparison is the opposite at higher fluence. Accurate measurement of LiF crystal and film PL response is important for precise characterization of the spatial, spectral, and coherence features of x-ray beams across the full profile and in localized areas. For such measurements, crucial LiF detector attributes are high spatial resolution and high dynamic range.
机译:LiF晶体和薄膜检测器用于测量自放大自发自发自由电子激光束的远场注量曲线和具有高空间分辨率的衍射成像。在这些测量中,在宽范围的软X射线通量范围内比较了LiF晶体和薄膜的光致发光(PL)响应。发现LiF晶体和膜的软X射线能量密度依赖性不同。在低通量下,与LiF薄膜相比,LiF晶体显示出更高的PL响应,而在高通量下则相反。 LiF晶体和薄膜PL响应的准确测量对于准确描述整个轮廓和局部区域中X射线束的空间,光谱和相干特征至关重要。对于此类测量,LiF检测器的关键属性是高空间分辨率和高动态范围。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号