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Three-degree-of-freedom displacement measurement using grating-based heterodyne interferometry

机译:基于光栅的外差干涉测量法的三自由度位移测量

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摘要

A heterodyne grating-based interferometer for three-degree-of-freedom (3-DOF) displacement measurement is proposed. This technique has the merits of both heterodyne interferometry and grating inter-ferometry. A heterodyne light beam is obtained using an electro-optic modulating technique for amplitude modulation. While the heterodyne light beam is normally incident into a transmission-type 2D grating, two detection parts for in-plane and out-of-plane displacement measurements will be obtained. The heterodyne light beam is utilized to carry the optical phase variation that results from grating displacement in three directions. The experimental results demonstrate that the proposed interferometer is capable of sensing the displacement of a motion stage in 3-DOF. The resolution and range of the measurement can achieve up to nanometric and millimetric levels.
机译:提出了一种基于外差光栅的三自由度(3-DOF)位移测量干涉仪。该技术具有外差干涉测量法和光栅干涉测量法的优点。使用用于振幅调制的电光调制技术获得外差光束。当外差光束通常入射到透射型2D光栅中时,将获得两个用于平面内和平面外位移测量的检测部分。外差光束用于承载由三个方向上的光栅位移引起的光学相位变化。实验结果表明,所提出的干涉仪能够感知3-DOF中运动平台的位移。测量的分辨率和范围可以达到纳米和毫米级别。

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