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首页> 外文期刊>Applied optics >Space-resolved 3 m normal incidence spectrometer for edge impurity diagnostics in the large helical device
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Space-resolved 3 m normal incidence spectrometer for edge impurity diagnostics in the large helical device

机译：空间分辨3 m正入射光谱仪，用于大型螺旋装置中的边缘杂质诊断

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摘要

A space-resolved vacuum ultraviolet (VUV) spectroscopy using a 3 m normal incidence spectrometer has been developed to measure the impurity profile in the edge ergodic layer composed of stochastic magnetic field by which the edge plasma in the large helical device (LHD) is uniquely characterized. It vertically measures the spatial profile of VUV lines emitted from impurities in the wavelength range of 3003200 A. The wavelength interval, Δλ, which can be measured in a single discharge, is about 37 A. A spectral resolution of 0.153 A, which results from an entrance slit width of the spectrometer of 20 μm, is adopted. The vertical observation range, ΔZ, can be switched by taking a convex mirror in and out, which enables both the edge profile measurement focused on the ergodic layer and the full profile measurement covering an entire vertical size of the LHD plasma, e.g., 165 ≤ ΔZ ≤ 200 mm and 1000 ≤ ΔZ ≤ 1250 mm for the R_(ax) = 3.6 m configuration, respectively, which shows a slight wavelength dependence. Precise calibrations on the line dispersion, spectral resolution, vertical range of the observable region, and the spatial resolution have been performed with a unique method. As a preliminary result, the ion temperature profile is obtained for CIV at 1548.20 A in the second order (denoted as 1548.20 × 2 A) in high-density helium discharges in addition to the emission profile with a time resolution of 100 ms in a multitrack CCD operation mode. The poloidal flow in the ergodic layer based on the Doppler-shift measurement of CIV at 1548.20 × 2 A is also observed in high-density hydrogen discharges.
机译：已开发出一种使用3 m正入射光谱仪的空间分辨真空紫外（VUV）光谱仪，以测量由随机磁场组成的边缘遍历层中的杂质分布，从而使大型螺旋装置（LHD）中的边缘等离子体具有独特性表征。它垂直测量了从3003200 A波长范围内的杂质发出的VUV线的空间分布。可以在单次放电中测量的波长间隔Δλ约为37A。光谱分辨率为0.153 A，这是由于光谱仪的入口狭缝宽度为20μm。垂直观察范围ΔZ可以通过插入和移出凸面镜来切换，这样既可以进行遍历遍历层的边缘轮廓测量，也可以覆盖LHD等离子体的整个垂直尺寸（例如165≤对于R_（ax）= 3.6 m配置，分别为ΔZ≤200 mm和1000≤ΔZ≤1250 mm，这显示出轻微的波长依赖性。已经使用一种独特的方法对线的色散，光谱分辨率，可观察区域的垂直范围以及空间分辨率进行了精确的校准。作为初步结果，在多轨中，除了具有100 ms时间分辨率的发射轮廓外，还获得了高密度氦气放电中CIV在第二级（表示为1548.20×2 A）处的CIV离子温度曲线。 CCD操作模式。在1548.20×2 A时，基于CIV的多普勒频移测量，遍历层中的极向性流动也可以在高密度氢放电中观察到。

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