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Survey of emissivity measurement by radiometric methods

机译:辐射法测量发射率

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A survey of the state of the art in the field of spectral directional emissivity measurements by using radiometric methods is presented. Individual quantity types such as spectral, band, or total emissivity are defined. Principles of emissivity measurement by various methods (direct and indirect, and calorimetric and radiometric) are discussed. The paper is focused on direct radiometric methods. An overview of experimental setups is provided, including the design of individual parts such as the applied reference sources of radiation, systems of sample clamping and heating, detection systems, methods for the determination of surface temperature, and procedures for emissivity evaluation. (C) 2015 Optical Society of America
机译:提出了通过使用辐射法在光谱方向发射率测量领域中的最新技术的概述。定义了各个数量类型,例如光谱,谱带或总发射率。讨论了通过各种方法(直接和间接,量热和辐射测量)测量发射率的原理。本文着重于直接辐射法。提供了实验设置的概述,包括各个部分的设计,例如所应用的辐射参考源,样品夹持和加热系统,检测系统,表面温度确定方法以及发射率评估程序。 (C)2015年美国眼镜学会

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