首页> 外文期刊>Applied optics >Use of single-negative material as a tunable defect in a dielectric photonic crystal heterostructure
【24h】

Use of single-negative material as a tunable defect in a dielectric photonic crystal heterostructure

机译:使用单负材料作为介电光子晶体异质结构中的可调缺陷

获取原文
获取原文并翻译 | 示例
           

摘要

The defect mode in a photonic crystal heterostructure of (1/2)(N) (2/1)(N) can be tuned by using a single-negative layer as a defect layer; that is, the structure to be considered is (1/2)D-N(2/1)(N), where 1, 2 are dielectrics, N is the stack number, and D is a defect layer taken to be a single-negative material. The results show that when D is a mu-negative (mu < 0) medium, the defect mode frequency is redshifted as a function of the thickness of D as well as the static permittivity. On the other hand, if D is an epsilon-negative (epsilon < 0) medium, the defect mode frequency is blueshifted as the defect layer thickness increases, but it is independent of the static permeability. We also investigate the angular dependence of the defect frequency for both two polarizations, transverse electric (TE) wave and transverse magnetic (TM) wave. The defect mode frequency is shown to be blueshifted as a function of the angle of incidence. Additionally, the shift in the TE wave is larger than that in the TM wave. (C) 2016 Optical Society of America
机译:通过使用单负层作为缺陷层,可以调整(1/2)(N)(2/1)(N)的光子晶体异质结构中的缺陷模式。也就是说,要考虑的结构是(1/2)DN(2/1)(N),其中1,2是电介质,N是堆叠数,D是被视为单负的缺陷层材料。结果表明,当D为mu负(mu <0)介质时,缺陷模式频率根据D的厚度和静电容率而发生红移。另一方面,如果D是ε负(ε<0)介质,则随着缺陷层厚度的增加,缺陷模式频率会发生蓝移,但与静磁导率无关。我们还研究了两种极化(横向电(TE)波和横向磁(TM)波)缺陷频率的角度依赖性。缺陷模式频率显示为根据入射角的蓝移。另外,TE波的偏移大于TM波的偏移。 (C)2016美国眼镜学会

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号