• 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>Applied optics >Effects of a measurement floor on Mueller matrix measurements in a dual rotating retarder polarimeter bidirectional scatter distribution function system
【24h】

Effects of a measurement floor on Mueller matrix measurements in a dual rotating retarder polarimeter bidirectional scatter distribution function system

机译：双旋转延迟器偏振计双向散射分布函数系统中测量平台对Mueller矩阵测量的影响

获取原文
获取原文并翻译 | 示例
           
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

Since a measurement of the bidirectional scatter distribution function (BSDF) of a material is proportional to the intensity of the scattered light, a BSDF measurement system with the addition of a dual rotating retarder polarimeter can be used to calculate the Mueller matrix of a scatterer. One advantage of a BSDF system using a laser source is its large dynamic range, which allows the measurement of scattered light both near to and away from the specular region. As BSDF measurements move away from the specular region and into a more diffuse-scatter region, the measured signal decreases and may approach the system's measurement floor. Therefore, BSDF and Mueller-matrix measurements are dependent not only on the scatter from the sample but also on the noise floor of the system. By analyzing numerically created bidirectional reflectance distribution function data, we show that since the noise floor of a system is typically constant, the Mueller-matrix measurement at the noise floor appears to be that of a perfect depolarizer. Therefore, as the BSDF measurement space moves away from the high-signal region and the noise floor is approached, the Mueller matrix assigned to the sample artificially approaches that of a perfect depolarizer. The rate and location in scatter-angle space of this shift is dependent on the BSDF of the material and on the signal-to-noise ratio in the system. Therefore, caution must be taken when drawing conclusions about measured Mueller matrices for scattered light, particularly in measurement regions where the measured signal approaches the system floor.
机译：由于材料的双向散射分布函数（BSDF）的测量与散射光的强度成正比，因此可以使用添加了双旋转延迟器旋光仪的BSDF测量系统来计算散射器的Mueller矩阵。使用激光源的BSDF系统的优点之一是动态范围大，可以测量靠近镜面区域和远离镜面区域的散射光。随着BSDF测量从镜面区域移到更漫散射的区域，被测信号会减小，并可能接近系统的测量底限。因此，BSDF和Mueller矩阵的测量不仅取决于样本的散射，还取决于系统的本底噪声。通过分析数值创建的双向反射率分布函数数据，我们表明，由于系统的本底噪声通常是恒定的，因此本底噪声的Mueller矩阵测量似乎是理想的去偏振器。因此，随着BSDF测量空间远离高信号区域并接近本底噪声，分配给样本的Mueller矩阵人为地接近了理想的去偏振器。这种偏移的速率和在散射角空间中的位置取决于材料的BSDF以及系统中的信噪比。因此，在得出关于散射光的测得的Mueller矩阵的结论时，尤其是在测得的信号接近系统基底的测量区域时，必须格外小心。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号