首页> 外文期刊>Applied optics >Accurate alignment of optical axes of a biplate using a spectroscopic Mueller matrix ellipsometer
【24h】

Accurate alignment of optical axes of a biplate using a spectroscopic Mueller matrix ellipsometer

机译:使用光谱Mueller矩阵椭偏仪精确对准双板的光轴

获取原文
获取原文并翻译 | 示例
           

摘要

The biplate that consists of two single wave plates made from birefringent materials with their fast axes oriented perpendicular to each other is one of the most commonly used retarders in many optical systems. The internal alignment of the optical axes of the two single wave plates is a key procedure in the fabrication and application of a biplate to reduce the spurious artifacts of oscillations in polarization properties due to the misalignment error and to improve the accuracy and precision of the systems using such biplates. In this paper, we propose a method to accurately align the axes of an arbitrary biplate by minimizing the oscillations in the characteristic parameter spectra of the biplate detected by a spectroscopic Mueller matrix ellipsometer (MME). We derived analytical relations between the characteristic parameters and the misalignment error in the biplate, which helps us to analyze the sensitivity of the characteristic parameters to the misalignment error and to evaluate the alignment accuracy quantitatively. Experimental results performed on a house-developed MME demonstrate that the alignment accuracy of the proposed method is better than 0.01 degrees in aligning the optical axes of a quartz biplate. (C) 2016 Optical Society of America
机译:双板由两个由双折射材料制成的单波板组成,其快速轴彼此垂直,是许多光学系统中最常用的延迟器之一。两个单波片的光轴的内部对准是双板制造和应用中的关键步骤,以减少由于未对准误差而导致的偏振特性振荡的伪造假象,并提高系统的精度和精确度使用这种双板。在本文中,我们提出了一种通过最小化光谱Mueller矩阵椭偏仪(MME)检测到的双板的特征参数谱中的振荡来精确对准任意双板的轴的方法。我们得出了双板中特征参数与失准误差之间的解析关系,这有助于我们分析特征参数对失准误差的敏感性,并定量评估对准精度。在自制的MME上进行的实验结果表明,该方法的对准精度在对准石英双板的光轴方面优于0.01度。 (C)2016美国眼镜学会

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号