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Temperature stability of ultra-thin mixed BaSr-oxide layers and their transformation

机译：超薄BaSr氧化物混合层的温度稳定性及其转变

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摘要

In the context of investigations of physical, chemical and electrical properties of ultra-thin layers of epitaxial and monocrystalline Sr _(0.3)Ba _(0.7)Oon Si(100), we also investigated their thermal stability with x-ray photoelectron spectroscopy (XPS), electron energy loss spectroscopy (EELS), and low energy electron diffraction (LEED). At temperatures above 400°C, transformation into silicate layers sets in. The stoichiometry after complete transformation was determined to be close to (Ba _(0.8)Sr _(0.2)) _2SiO _4 except for layers of only a few monolayers, where the silicate is not stoichiometric. There are strong indications that this silicate is stable until it desorbs at temperatures above 750°C. Crystallinity, as seen with LEED, is lost during this transformation. Although transformation into silicate is coupled with metal desorption and compactification of the layers, they seem to remain closed. In addition, traces of Ba silicide at the Si interface were detected after layer desorption. This silicide cannot be desorbed thermally. The silicate layer has a bandgap of 5.9±0.2eV already for 3ML thickness. Upon exposure to air, carbon and oxygen containing species, but no hydroxide, are formed irreversibly.
机译：在研究外延和单晶Sr _（0.3）Ba _（0.7）Oon Si（100）超薄层的物理，化学和电学性质的背景下，我们还通过X射线光电子能谱研究了它们的热稳定性（ XPS），电子能量损失谱（EELS）和低能电子衍射（LEED）。在高于400°C的温度下，转变成硅酸盐层。完全转变后的化学计量被确定为接近（Ba _（0.8）Sr _（0.2））_2SiO _4，除了只有几个单层的层外，硅酸盐不是化学计量的。有强烈的迹象表明，这种硅酸盐直到在750°C以上的温度下解吸才稳定。如在LEED中所见，结晶度在此转换过程中丢失了。尽管转变成硅酸盐与金属的解吸和层的致密化有关，但它们似乎保持封闭。另外，在层解吸之后，在Si界面处检测到痕量的Ba硅化物。该硅化物不能热解吸。对于3ML的厚度，硅酸盐层已经具有5.9±0.2eV的带隙。暴露于空气中时，不可逆地形成含碳和氧的物质，但没有氢氧化物。

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