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首页> 外文期刊>Nanotechnology >Mapping nanoscale elasticity and dissipation using dual frequency contact resonance AFM
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Mapping nanoscale elasticity and dissipation using dual frequency contact resonance AFM

机译：使用双频接触共振AFM绘制纳米级弹性和耗散图

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摘要

We report on a technique that simultaneously quantifies the contact stiffness and dissipation of an AFM cantilever in contact with a surface, which can ultimately be used for quantitative nanomechanical characterization of surfaces. The method is based on measuring the contact resonance frequency using dual AC resonance tracking (DART), where the amplitude and phase of the cantilever response are monitored at two frequencies on either side of the contact resonance. By modelling the tip-sample contact as a driven damped harmonic oscillator, the four measured quantities (two amplitudes and two phases) allow the four model parameters, namely, drive amplitude, drive phase, resonance frequency and quality factor, to be calculated. These mechanical parameters can in turn be used to make quantitative statements about localized sample properties. We apply the method to study the electromechanical coupling coefficients in ferroelectric materials and the storage and loss moduli in viscoelastic materials.
机译：我们报告了一种技术，该技术可同时量化与表面接触的AFM悬臂的接触刚度和耗散，最终可用于表面的定量纳米力学表征。该方法基于使用双AC共振跟踪（DART）测量接触共振频率的方法，其中在接触共振的任一侧以两个频率监视悬臂响应的幅度和相位。通过将尖端样本触点建模为驱动阻尼谐波振荡器，四个测量量（两个振幅和两个相位）允许计算四个模型参数，即驱动振幅，驱动相位，谐振频率和品质因数。这些机械参数又可以用来对局部样品的特性进行定量说明。我们应用该方法研究铁电材料中的机电耦合系数以及粘弹性材料中的储能模量和损耗模量。

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