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Characterization of multi-walled carbon nanotube-polymer nanocomposites by scanning spreading resistance microscopy

机译:扫描扩散电阻显微镜表征多壁碳纳米管-聚合物纳米复合材料

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摘要

Nanocomposites of aligned multi-walled carbon nanotubes (CNTs) embedded in a polymer matrix yield a unique combination of thermal and electrical properties and mechanical strength. These properties are intimately related to the composite nanostructure and to the growth and processing conditions. The alignment of the tubes, the filling fraction and the contact junction between the nanotubes are key parameters controlling the composite electrical conductivity. For this purpose, a full description of the composite nanostructure is required. Among the non-destructive scanning probe techniques, scanning spreading resistance microscopy is found to be a powerful technique in identifying the carbon nanotubes with true nanometer resolution, thus competing with SEM and TEM imaging. Additionally, the technique provides valuable information about the electrical conduction mechanism within the composite structure. Indeed, by using a controlled contact force and an appropriate model of conduction at the nanoscale, the tip-CNT contact resistance, the CNT intrinsic resistance and the CNT-epoxy-CNT resistance junction are evaluated. This latter is found to be the factor controlling the overall electrical conductivity of the composite.
机译:嵌入聚合物基体中的对齐多壁碳纳米管(CNT)纳米复合材料可产生热,电性能和机械强度的独特组合。这些性质与复合纳米结构以及生长和加工条件密切相关。管的排列,填充分数和纳米管之间的接触结是控制复合材料电导率的关键参数。为此,需要对复合纳米结构的完整描述。在无损扫描探针技术中,发现扫描扩展电阻显微镜技术是识别具有真正纳米分辨率的碳纳米管的有力技术,因此可与SEM和TEM成像竞争。另外,该技术提供了有关复合结构内导电机制的有价值的信息。实际上,通过使用受控的接触力和适当的纳米级导电模型,可以评估尖端CNT的接触电阻,CNT的固有电阻和CNT-环氧-CNT的电阻结。发现后者是控制复合材料的总电导率的因素。

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