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Exploring atomic-scale lateral forces in the attractive regime: A case study on graphite (0001)

机译：探索有吸引力状态下的原子尺度侧向力：以石墨为例（0001）

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摘要

A non-contact atomic force microscopy-based method has been used to map the static lateral forces exerted on an atomically sharp Pt/Ir probe tip by a graphite surface. With measurements carried out at low temperatures and in the attractive regime, where the atomic sharpness of the tip can be maintained over extended time periods, the method allows the quantification and directional analysis of lateral forces with piconewton and picometer resolution as a function of both the in-plane tip position and the vertical tip-sample distance, without limitations due to a finite contact area or to stick-slip-related sudden jumps of tip apex atoms. After reviewing the measurement principle, the data obtained in this case study are utilized to illustrate the unique insight that the method offers. In particular, the local lateral forces that are expected to determine frictional resistance in the attractive regime are found to depend linearly on the normal force for small tip-sample distances.
机译：基于非接触原子力显微镜的方法已被用来绘制由石墨表面施加在原子上尖锐的Pt / Ir探针尖端上的静态侧向力。通过在低温和有吸引力的状态下进行测量，可以在更长的时间内保持尖端的原子锐利度，该方法可以对侧向力进行量化和方向分析，皮克顿和皮克计分辨率是两者的函数。平面内笔尖位置和笔尖垂直样品距离，不受有限接触面积或笔尖顶点原子与粘滑相关的突然跳跃的限制。在回顾了测量原理之后，本案例研究中获得的数据被用来说明该方法提供的独特见解。尤其是，对于较小的针尖样本距离，发现在吸引力范围内预期将确定摩擦阻力的局部侧向力线性依赖于法向力。

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