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Growth of straight one-dimensional Ge/ZnSe heterojunctions with atomically sharp interfaces by catalytic residue controls

机译:通过催化残留物控制生长具有原子锐利界面的直形一维Ge / ZnSe异质结

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摘要

One-dimensional (1D) heteroepitaxy with an abrupt interface is essential to construct the 1D heterojunctions required for photonic and electronic devices. During catalytic 1D heteroepitaxial growth, however, the heterojunctions are generically kinked and composition-diffused across the interfaces. Here, we report a simple synthetic route for straight 1D heteroepitaxy with atomically sharp interfaces of group IV(Ge)/group II-VI(ZnSe) nanowires (NWs) during Au-catalytic growth. Specifically, it is discovered that eliminating residues in Au catalysts by Se vapour treatments lowers the energy barrier for the Ge NW axial heteroepitaxy on ZnSe NWs, and forms atomically abrupt heterointerfaces. We verified such 1D variation in the local electronic band structure of the grown Ge/ZnSe NW heterojunctions with spatially resolved photocurrent measurements.
机译:具有突变界面的一维(1D)异质外延对于构建光子和电子设备所需的1D异质结至关重要。然而,在催化一维异质外延生长期间,异质结通常会扭结并在界面上扩散。在这里,我们报告了一个简单的合成路线,用于在Au催化生长过程中具有IV(Ge)/ II-VI(ZnSe)纳米线(NWs)原子尖锐界面的直的一维异质外延。具体地,发现通过Se蒸气处理消除Au催化剂中的残留物降低了ZnSe NWs上的Ge NW轴向异质外延的能垒,并形成原子突变的异质界面。我们用空间分辨光电流测量结果验证了生长的Ge / ZnSe NW异质结的局部电子能带结构中的一维变化。

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