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Planar temperature sensing using heavy- metal-free quantum dots with micrometer resolution

机译:使用具有微米分辨率的不含重金属的量子点进行平面温度感测

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This work describes a micrometer resolution and plane-array temperature-sensing method using the photoluminescence (PL) of ZnCuInS/ZnSe/ZnS quantum dots (QDs). Heavy-metal-free QDs were directly deposited on a printed circuit board to analyze the surface temperature of the devices on the board. An optical ? ber monochromator and a high-powered microscope were employed to fabricate a system which could collect temperature-dependent QD emissions from the micrometer area for the temperature measurements. This system realizes the imaging of the surface temperature distribution in the planar micrometer area. Temperature sensitivity of the PL intensity reached 0.66% °C ~(-1) , and the relative error was less than 2%.
机译:这项工作描述了使用ZnCuInS / ZnSe / ZnS量子点(QD)的光致发光(PL)的微米分辨率和平面阵列温度传感方法。将不含重金属的QD直接沉积在印刷电路板上,以分析板上设备的表面温度。光学的?使用ber单色仪和高功率显微镜制造了一个系统,该系统可以从千分尺区域收集与温度有关的QD发射,以进行温度测量。该系统实现了在平面微米区域内表面温度分布的成像。 PL强度的温度敏感性达到0.66%°C〜(-1),相对误差小于2%。

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