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Determination of the number of atoms present in nano contact based on shot noise measurements with highly stable nano-fabricated electrodes

机译：使用高度稳定的纳米加工电极，基于散粒噪声测量，确定纳米接触中存在的原子数

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摘要

A highly stable experimental setup was developed for the measurement of shot noise in atomic contacts and molecular junctions to determine the number of atoms or molecules present. The use of a nano-fabricated mechanically controllable break junction (MCBJ) electrode improved the overall stability of the experimental setup. The improved stability of the system and optimization of measurement system enabled us to comprehensively investigate the shot noise as well as charge transport properties in Au atomic contacts and molecular junctions. We present a solid proof that the number of atoms (cross sectional atom) in the Au atomic contacts was exactly one. In the atomic contacts, contribution from the additional channels was under the detection limit. Furthermore, the effect of molecular adsorption on the charge transport in the Au atomic contact was investigated. Additional transport channels were opened by exposing pyrazine molecules to the Au contacts, which gave rise to an increase in the Fano factor in the shot noise.
机译：开发了一种高度稳定的实验装置，用于测量原子接触和分子结中的散粒噪声，以确定存在的原子或分子的数量。纳米制造的机械可控断开结（MCBJ）电极的使用改善了实验装置的整体稳定性。系统稳定性的提高和测量系统的优化使我们能够全面研究散粒噪声以及金原子接触和分子结中的电荷传输性质。我们提供了一个可靠的证据，证明Au原子接触中的原子数（截面原子）恰好是一个。在原子接触中，来自其他通道的贡献低于检测极限。此外，研究了分子吸附对金原子接触中电荷传输的影响。通过将吡嗪分子暴露于Au触点而打开了其他传输通道，这导致散粒噪声中的Fano因子增加。

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