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Focal plane tuning in wide-field-of-view microscope with Talbot pattern illumination

机译:Talbot图案照明在宽视野显微镜中进行焦平面调整

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摘要

We have developed a focal plane tuning technique for use in focus-grid-based wide-field-of-view microscopy (WFM). In WFM, the incidence of a collimated beam on a mask with a two-dimensional grid of aperture produced the Talbot images of the aperture grid. The Talbot pattern functioned as a focus grid and was used to illuminate the sample. By scanning the sample across the focus grid and collecting the transmission, we can generate a microscopy image of the sample. By tuning the wavelength of the laser, we can tune the focal plane of the WFM and acquire images of different depth into the sample. Images of a green algae microscope slide were acquired at different focal planes for demonstration.
机译:我们已经开发了一种焦平面调整技术,可用于基于聚焦网格的宽视场显微镜(WFM)。在WFM中,准直光束入射在具有二维孔径网格的面罩上会产生孔径网格的Talbot图像。塔尔伯特(Talbot)模式用作聚焦网格,用于照亮样品。通过在聚焦网格上扫描样本并收集透射率,我们可以生成样本的显微镜图像。通过调整激光的波长,我们可以调整WFM的焦平面并获取样品中不同深度的图像。在不同的焦平面上采集了绿藻显微镜载玻片的图像以进行演示。

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