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Rapid assessment of mid-infrared refractive index anisotropy using a prism coupler: chemical vapor deposited ZnS

机译：使用棱镜耦合器快速评估中红外折射率各向异性：化学气相沉积ZnS

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摘要

A state-of-the-art mid-infrared prism coupler was used to study suspected anisotropy in the refractive index of forward-looking-infrared grade chemical vapor deposited (CVD) zinc sulfide. Samples were prepared with columnar grain structure in and perpendicular to the sample plane, as well as from different depths in the CVD growth body. This study was motivated by the growing industry concern among optical design engineers, as well as developers of mid-infrared systems, over the reliability of historically accepted index data. Prior photoluminescence and x-ray diffraction measurements have suggested that refractive index may vary according to sample orientation with respect to the grain structure. Measurements were conducted to provide optical dispersion and thermal index (dn/dT) data at discrete laser wavelengths between 0.633 and 10.591 (mu)m at two temperature set points (30 deg C and 90 deg C). Refractive index measurements between samples exhibited an average standard deviation comparable to the uncertainty of the prism coupler measurement (0.0004 refractive index units), suggesting that the variation in refractive index as a function of sample orientation and CVD deposition time is negligible and should have no impact on subsequent optical designs. Measured dispersion data at mid-infrared wavelengths were also found to agree well with prior published measurements.
机译：使用最先进的中红外棱镜耦合器研究前视红外级化学气相沉积（CVD）硫化锌的折射率中的可疑各向异性。在样品平面内并垂直于样品平面以及从CVD生长体的不同深度制备具有柱状晶粒结构的样品。这项研究的动机是，光学设计工程师以及中红外系统的开发人员对历史上可接受的索引数据的可靠性日益关注。先前的光致发光和X射线衍射测量表明，折射率可能会根据样品相对于晶粒结构的取向而变化。进行测量以在两个温度设定点（30℃和90℃）下在0.633和10.591μm之间的离散激光波长下提供光学色散和热指数（dn / dT）数据。样品之间的折射率测量显示出的平均标准偏差可与棱镜耦合器测量的不确定度（0.0004折射率单位）相比较，这表明折射率随样品取向和CVD沉积时间的变化可以忽略不计，应该没有影响。在后续的光学设计中。还发现在中红外波长下测得的色散数据与先前公布的测量结果非常吻合。

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