Measurement method for light transmittance of layered metamaterials

Akihiro Isozaki; Tetsuo Kan; Yoshiharu Ajiki; Kiyoshi Matsumoto; Isao Shimoyama

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Measurement method for light transmittance of layered metamaterials

机译：层状超材料的透光率的测量方法

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We propose a method to measure light transmittance of layered metamaterials by placing the metamaterials directly on a Si photodiode. Our measurement method enables the direct detection of transmitted light that appears as an evanescent wave in natural materials. Here, we report the transmittance measurements of a typical metamaterial using this method. The metamaterial was composed of Ag/Al_2O_3 layers and was fabricated by direct evaporation on the Si photodiode. The measured transmittance agrees with the simulated transmittance. Our results confirmed that this measurement method can determine the transmittance properties of metamaterials and that it is applicable to other types of metamaterials.

机译：我们提出了一种通过将超材料直接置于Si光电二极管上来测量层状超材料的透光率的方法。我们的测量方法可以直接检测在天然材料中以van逝波形式出现的透射光。在这里，我们报告使用这种方法的典型超材料的透射率测量。该超材料由Ag / Al_2O_3层组成，并通过直接蒸发在Si光电二极管上制成。测得的透射率与模拟透射率一致。我们的结果证实，该测量方法可以确定超材料的透射率特性，并且适用于其他类型的超材料。

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《Optics Letters》 |2013年第11期|共3页
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Akihiro Isozaki; Tetsuo Kan; Yoshiharu Ajiki; Kiyoshi Matsumoto; Isao Shimoyama;
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Measurement method for light transmittance of layered metamaterials

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