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首页> 外文期刊>Optics Letters >InP-based short-wave infrared and midwave infrared photodiodes using a novel type-II strain-compensated quantum well absorption region
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InP-based short-wave infrared and midwave infrared photodiodes using a novel type-II strain-compensated quantum well absorption region

机译:使用新型II型应变补偿量子阱吸收区的基于InP的短波红外和中波红外光电二极管

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摘要

We report on InP-based p-type/intrinsic-type (PIN) photodiodes with a novel strain-compensated type-II InGaAs/GaAsSb quantum well active region. The device has optical response out to 3.0 μm, specific detectivity (D~*) of 7.73 × 10~9 cm Hz~(0.5)/W at 290 K for 2.7 μm. These preliminary results show that this novel strain-compensated approach leads to similar performance when compared to a conventional strain-compensated approach.
机译:我们报告基于InP的p型/本征/ n型(PIN)光电二​​极管与新型应变补偿II型InGaAs / GaAsSb量子阱活性区域。该器件的光学响应高达3.0μm,在290 K波长下对2.7μm的比探测灵敏度(D〜*)为7.73×10〜9 cm Hz〜(0.5)/ W。这些初步结果表明,与传统的应变补偿方法相比,这种新颖的应变补偿方法具有相似的性能。

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