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Conical refraction as a tool for polarization metrology

机译:锥形折射作为偏振计量的工具

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A method for polarization metrology based on the conical refraction (CR) phenomenon, occurring in biaxial crystals, is reported. CR transforms an input Gaussian beam into a light ring whose intensity distribution is linked to the incoming polarization. We present the design of a division-of-amplitude complete polarimeter composed of two biaxial crystals, whose measurement principle is based on the CR phenomenon. This design corresponds to a static polarimeter, that is, without mechanical movements or electrical signal addressing. Only one division-of-amplitude device is required, besides the two biaxial crystals, to completely characterize any state of polarization, including partially polarized and unpolarized states. In addition, a mathematical model describing the system is included. Experimental images of the intensity distribution related to different input polarization states are provided. These intensity patterns are compared with simulated values, proving the potential of polarimeters based on biaxial crystals.
机译:报道了一种基于双轴晶体中的锥形折射(CR)现象的偏振计量方法。 CR将输入的高斯光束转换成光环,其强度分布与入射偏振有关。我们提出了一种由两个双轴晶体组成的分频完全偏振计的设计,其测量原理基于CR现象。此设计对应于静态旋光仪,也就是说,没有机械运动或电信号寻址。除了两个双轴晶体之外,仅需要一个分频器件即可完全表征任何偏振态,包括部分偏振态和非偏振态。此外,还包括描述系统的数学模型。提供了与不同输入偏振态有关的强度分布的实验图像。将这些强度模式与模拟值进行比较,证明了基于双轴晶体的偏振计的潜力。

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