The spectroscopic pump-probe reflectance method was used to investigate recombination dynamics in samples of nanocrystalline silicon embedded in a matrix of hydrogenated amorphous silicon. We found that the dynamics can be described by a rate equation including linear and quadratic terms corresponding to recombination processes associated with impurities and impurity-assisted Auger ionization, respectively. We determined the values of the recombination coefficients using the initial concentrations method. We report the coefficients of 1.5 x 10(11) s(-1) and 1.1 x 10(-10) cm(3) s(-1) for the impurity-assisted recombination and Auger ionization, respectively. (C) 2015 Optical Society of America
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机译：光谱泵浦探针反射法用于研究嵌入氢化非晶硅基质中的纳米晶硅样品的复合动力学。我们发现动力学可以通过速率方程来描述，该方程包括线性和二次项，分别对应于与杂质和杂质辅助俄歇电离相关的重组过程。我们使用初始浓度方法确定重组系数的值。我们报告了杂质辅助重组和俄歇电离的系数分别为1.5 x 10（11）s（-1）和1.1 x 10（-10）cm（3）s（-1）。 （C）2015年美国眼镜学会
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