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Application of point diffraction interferometry for middle spatial frequency roughness detection

机译:点衍射干涉仪在中空频率粗糙度检测中的应用

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The possibilities of applying the point diffraction interferometry (PDI) method for the detection of the middle spatial frequency roughness of superpolished optical surfaces are analyzed. The point source used in the experiment is based on a single mode optical fiber with the subwavelength exit aperture size, which is about 0.25 mu m. In a numerical aperture of 0.01 the reference wave root-mean-square deformation is less than 0.005 nm. It is theoretically shown that the possible diffraction-limited lateral resolution of PDI while measuring a spherical substrate of 100 mm curvature radius is about 8 mu m. The experiment demonstrated the possibility of obtaining roughness spectra in the range 0.001-0.05 mu m(-1). The surface map obtained by PDI, and the roughness spectra obtained by both the PDI and atomic-force microscopy methods are shown. (C) 2015 Optical Society of America
机译:分析了应用点衍射干涉法(PDI)方法检测超抛光光学表面的中间空间频率粗糙度的可能性。实验中使用的点光源基于单模光纤,其亚波长出射孔尺寸约为0.25μm。在0.01的数值孔径中,参考波均方根变形小于0.005 nm。从理论上讲,在测量曲率半径为100 mm的球形基板时,PDI可能受到衍射限制的横向分辨率约为8μm。实验证明了获得0.001-0.05μm(-1)范围内的粗糙度光谱的可能性。显示了通过PDI获得的表面图,以及通过PDI和原子力显微镜方法获得的粗糙度光谱。 (C)2015年美国眼镜学会

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