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Surface wave illumination Fourier ptychographic microscopy

机译：表面波照度傅里叶质谱分析

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摘要

We propose a novel microscopy method, combining surface wave illumination and the Fourier ptychographic microscopy (FPM) algorithm to achieve super-resolution (SR) imaging. In our system, an oil-immersion objective lens is used to excite both the total internal reflection (TIR) evanescent waves and the surface plasmon waves (SPWs), which illuminate the sample with large wave vectors. Through the FPM algorithm, a resolution approximately twice that of conventional wide-field microscopy is obtained. Meanwhile, we could retrieve the sample's quantitative phase map in order to obtain its surface profile. Importantly, the field enhancement from a SPW has improved the contrast of the reconstructed images, which is critical for revealing the finer structural details of the specimen. In our experiments, we have imaged metallic gratings with a 120 or 150 nm wide line and trench features. We accurately retrieved their axial dimensions with a lateral resolution better than 240 nm that is close to the theoretical resolution of 215 nm, thus demonstrating the quantitative phase imaging capability of our technique. As this approach provides a label-free solution for intensity and phase imaging of samples with lateral resolution exceeding the limit introduced by the optical system, it can be potentially used in a wide range of noninvasive biological imaging applications. (C) 2016 Optical Society of America.
机译：我们提出了一种新颖的显微镜方法，结合了表面波照明和傅立叶色谱分析（FPM）算法来实现超分辨率（SR）成像。在我们的系统中，使用油浸物镜来激发全内反射（TIR）van逝波和表面等离激元波（SPW），它们以大的波矢量照射样品。通过FPM算法，可获得大约两倍于传统广角显微镜的分辨率。同时，我们可以检索样品的定量相图以获得其表面轮廓。重要的是，SPW的场增强功能改善了重建图像的对比度，这对于揭示样品的精细结构细节至关重要。在我们的实验中，我们为具有120或150 nm宽的线和沟槽特征的金属光栅成像。我们准确地获取了其轴向尺寸，其横向分辨率优于240 nm，该分辨率接近于215 nm的理论分辨率，从而证明了我们技术的定量相位成像能力。由于这种方法为横向分辨率超过光学系统引入极限的样品的强度和相位成像提供了一种无标记的解决方案，因此它有可能被广泛用于无创生物成像应用中。 （C）2016年美国眼镜学会。

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