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Dark-field imaging as a noninvasive method for characterization of whispering gallery modes in microdisk cavities

机译:暗场成像是微盘腔中回音壁模式表征的一种非侵入性方法

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Whispering gallery mode microdisk cavities fabricated by direct laser writing are studied using dark-field imaging and spectroscopy in the visible spectral range. Dark-field imaging allows us to directly visualize the spatial intensity distribution of whispering gallery modes. We extract their azimuthal and radial mode indices from dark-field images, and find the axial mode number from the dispersion relation. The scattering spectrum obtained in the confocal arrangement provides information on the density of optical states in the resonator. The proposed technique is a simple noninvasive way to characterize the optical properties of microdisk cavities. (C) 2016 Optical Society of America
机译:通过在可见光谱范围内使用暗场成像和光谱学研究了通过直接激光写入制造的回音壁模式微盘腔。暗场成像使我们可以直接可视化耳语画廊模式的空间强度分布。我们从暗场图像中提取它们的方位角和径向模态指数,并从色散关系中找到轴向模态数。在共焦布置中获得的散射光谱提供了有关谐振器中光学状态密度的信息。提出的技术是一种简单的非侵入性方法来表征微盘腔的光学特性。 (C)2016美国眼镜学会

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