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首页> 外文期刊>Physical chemistry chemical physics: PCCP >Improving correlated SERS measurements with scanning electron microscopy: an assessment of the problem arising from the deposition of amorphous carbon
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Improving correlated SERS measurements with scanning electron microscopy: an assessment of the problem arising from the deposition of amorphous carbon

机译：用扫描电子显微镜改善相关的SERS测量：评估无定形碳沉积引起的问题

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摘要

For surface-enhanced Raman scattering (SERS) substrates with nonspherical symmetry, it is critical to correlate spectroscopy measurements with imaging by scanning electron microscopy (SEM). However, the deposition of carbon resulting from e-beam exposure during SEM imaging contaminates the surface of nanoparticles, potentially preventing their further functionalization with Raman probe molecules. In addition, the deposited carbon leads to unwanted background SERS signals. In this study, we systematically investigated the deposition of carbon during SEM imaging and examined how it affects the functionalization of nanoparticles with probe molecules and impacts the detection of SERS signals. Significantly, we found that the carbon could be removed or replaced from the surface of Ag nanoparticles through chemical or physical means, rendering the nanoparticles the capability for correlated SEM/SERS studies.
机译：对于具有非球形对称性的表面增强拉曼散射（SERS）基板，将光谱测量与通过扫描电子显微镜（SEM）成像相关联至关重要。但是，由于在SEM成像过程中电子束暴露而导致的碳沉积会污染纳米颗粒的表面，从而有可能阻止其通过拉曼探针分子的进一步功能化。此外，沉积的碳会导致有害的本底SERS信号。在这项研究中，我们系统地研究了SEM成像过程中碳的沉积，并研究了碳如何影响带有探针分子的纳米颗粒的功能性以及如何影响SERS信号的检测。重要的是，我们发现碳可以通过化学或物理手段从Ag纳米颗粒的表面去除或置换，从而使纳米颗粒具有进行相关SEM / SERS研究的能力。

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