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首页> 外文期刊>Physica, B. Condensed Matter >Quantitative measurement of deformation field around low-angle grain boundaries by electron microscopy
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Quantitative measurement of deformation field around low-angle grain boundaries by electron microscopy

机译：用电子显微镜定量测量低角度晶界周围的形变场

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The strain field of low-angle grain boundaries in gold was experimentally investigated. The grain boundaries consist of the arrangement of discrete dislocations. High-resolution transmission electron microscopy (HRTEM) and geometric phase analysis (GPA) were employed to map the strain field of grain boundaries. The numerical moire method was used to visualize the dislocations. The strain components epsilon(xx), epsilon(yy), epsilon(xy) and rigid rotation omega(xy) were mapped. The dislocation core regions are convergence regions of strain. The largest values of strain occur in the immediate dislocation core region. The strain field around an edge dislocation was compared with Peierls-Nabarro dislocation model. The comparison result has demonstrated that the Peierls-Nabarro model can describe the strain field around edge dislocation. (c) 2007 Elsevier B.V. All rights reserved.
机译：实验研究了金的低角度晶界的应变场。晶界由离散位错的排列组成。高分辨率透射电子显微镜（HRTEM）和几何相分析（GPA）被用来绘制晶界的应变场。莫尔数值方法用于使位错可视化。绘制了应变分量epsilon（xx），epsilon（yy），epsilon（xy）和刚度旋转ω（xy）。位错核心区域是应变的收敛区域。应变的最大值出现在直接位错核心区域。将边缘位错周围的应变场与Peierls-Nabarro位错模型进行了比较。比较结果表明，Peierls-Nabarro模型可以描述边缘位错周围的应变场。 （c）2007 Elsevier B.V.保留所有权利。

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