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Extraction of important electrical parameters of CuO

机译:CuO重要电参数的提取

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摘要

Conductivity, X-ray diffraction (XRD), optical absorption and atomic force microscopy (AFM) measurements of CuO thin film were presented. Three distinct electrical conduction contributions with discrete characteristic activation energies were observed. The applicability of various theoretical models was considered to explain results on electrical transport. We extracted important electrical parameters of CuO, which might be useful for its gas sensor applications.
机译:介绍了CuO薄膜的电导率,X射线衍射(XRD),光吸收和原子力显微镜(AFM)测量。观察到具有不同的特征活化能的三个不同的电传导贡献。各种理论模型的适用性被认为可以解释有关电传输的结果。我们提取了重要的CuO电参数,这可能对其气体传感器应用有用。

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