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首页> 外文期刊>Physica, C. Superconductivity and its applications >Relationship between intrinsic surface resistance and critical current density of YBCO thin films with various thickness
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Relationship between intrinsic surface resistance and critical current density of YBCO thin films with various thickness

机译：不同厚度的YBCO薄膜的固有表面电阻与临界电流密度的关系

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摘要

We investigated the relationship between the intrinsic surface resistance (R~(int)_s) and critical current density (J_c) of YBa_2Cu_3Oy (YBCO) film thinner than the penetration depth (k_L). The measured YBCO films were deposited on CeO _2-buffered r-cut Al_2O_3 substrates by the pulsed laser deposition method. The thicknesses of these films were 300, 200, and 100 nm, respectively. The R~(int)_s means the surface resistance of YBCO film removing the loss by the impedance of the substrates. The effective surface resistance (Rf) including the impedance of the substrate and the J _c of each YBCO film were measured using the dielectric resonator method at 21.8 GHz and the inductive method. We calculated R~(int)_s by using phenomenological expressions and the R~(eff)_s value. The R~(int)_s values of each YBCO film were almost the same in the measured temperature region. As a result, we found that R~(int)_s was in inverse proportion to the J_c of YBCO film thinner than λ_L.
机译：我们研究了比穿透深度（k_L）薄的YBa_2Cu_3Oy（YBCO）膜的固有表面电阻（R〜（int）_s）与临界电流密度（J_c）之间的关系。通过脉冲激光沉积法将测得的YBCO薄膜沉积在CeO _2缓冲的r切Al_2O_3衬底上。这些膜的厚度分别为300、200和100nm。 R_（int）_s是指YBCO膜的表面电阻消除了由基板的阻抗引起的损耗。使用介电共振器方法在21.8 GHz下和感应法测量包括基板阻抗和每个YBCO膜的J _c的有效表面电阻（Rf）。我们使用现象学表达式和R〜（eff）_s值来计算R〜（int）_s。每个YBCO膜的R〜（int）_s值在测得的温度范围内几乎相同。结果，我们发现R_（int）_s与比λ_L薄的YBCO膜的J_c成反比。

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