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Auger effect as the origin of the fast-luminescent band of freshly anodized porous silicon

机译:俄歇效应是刚阳极氧化的多孔硅快速发光带的起源

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摘要

Time-resolved photoluminescence measurements are performed on oxidized and fresh porous silicon at room temperature. Comparing the evolution of the nanosecond time-delayed photoluminescence (PL) in both cases, a new feature of the PL spectra is identified: a fast red band, present both in fresh and aged samples. The nonlinear excitation intensity dependence of this component is described by a simple model, where the Auger effect inside isolated silicon quantum dots plays the dominant role. [S0163-1829(99)03932-6]. [References: 19]
机译:时间分辨的光致发光测量是在室温下对氧化的新鲜多孔硅进行的。比较两种情况下纳秒级延时光致发光(PL)的演变,可以确定PL光谱的新特征:在新鲜和老化样品中均存在快速红带。用一个简单的模型描述了该成分的非线性激发强度依赖性,其中孤立硅量子点内部的俄歇效应起主要作用。 [S0163-1829(99)03932-6]。 [参考:19]

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