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首页> 外文期刊>Physical Review, B. Condensed Matter >Atomic depth distribution and effects of surfactants in growth of Ag and Au on Si(111)-root 3x root 3-Ga(1ML),-4x1-In and-2 root 3x2 root 3-Sn surfaces at room temperature - art. no. 085316
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Atomic depth distribution and effects of surfactants in growth of Ag and Au on Si(111)-root 3x root 3-Ga(1ML),-4x1-In and-2 root 3x2 root 3-Sn surfaces at room temperature - art. no. 085316

机译:室温下Si(111)-根3x根3-Ga(1ML),-4x1-In和-2根3x2根3-Sn表面上Ag和Au的原子深度分布以及表面活性剂的生长-艺术。没有。 085316

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The atomic depth distribution and growth modes in six growth processes, the growth of Ag and Au on root3xroot3-Ga(1 ML), 4x1-In, and 2root3x2root3-Sn surfaces, were studied at room temperature by using reflection high-energy electron diffraction and characteristic x-ray measurements as functions of glancing angle theta(g) of the incident electron beam. In all growth processes, intermixing between a preadsorbed metal [metal A, (Ga, In, Sn)] and a grown metal [metal B (Ag, Au)] was observed after deposition of 1 ML of metal B. During further deposition of metal B, three growth modes were observed: (i) further intermixing between metal A and metal B (Ag/In and Ag/Sn), (ii) segregation of metal A to the uppermost layers (Ag/Ga, Au/Ga), and (iii) segregation of a part of metal A to the uppermost layers and intermixing of the other part of metal A with metal B (Au/In, and Au/Sn). In all processes, metal A acted as a surfactant, i.e., the surface roughness was suppressed by preadsorption of metal A, resulting in a layer-by-layer growth mode of metal B. [References: 45]
机译:通过反射高能电子衍射在室温下研究了在根3xroot3-Ga(1 ML),4x1-In和2root3x2root3-Sn表面上Ag和Au的六个生长过程的原子深度分布和生长模式。和特征X射线测量值随入射电子束的掠射角theta(g)的变化而变化。在所有生长过程中,沉积1 ML的金属B后,都观察到预吸附的金属[金属A,(Ga,In,Sn)]和生长的金属[金属B(Ag,Au)]之间的混合。金属B观察到三种生长模式:(i)金属A和金属B之间进一步混合(Ag / In和Ag / Sn),(ii)金属A偏析到最上层(Ag / Ga,Au / Ga) (iii)将一部分金属A隔离到最上层,并将另一部分金属A与金属B(Au / In和Au / Sn)混合。在所有过程中,金属A都充当表面活性剂,即通过金属A的预吸附抑制了表面粗糙度,从而形成了金属B的逐层生长方式。[参考文献:45]

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