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首页> 外文期刊>The journal of physical chemistry, C. Nanomaterials and interfaces >Tracing Gold Nanoparticle Charge by Electrolyte-Insulator-Semiconductor Devices
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Tracing Gold Nanoparticle Charge by Electrolyte-Insulator-Semiconductor Devices

机译：电解质-绝缘体-半导体器件追踪金纳米粒子电荷

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摘要

A capacitive field-effect electrolyte—insulator—semiconductor (EIS) device was applied for the first time to trace the charge of supported gold nanoparticles (Au-NPs) induced by oxygen plasma treatment or due to storing in aqueous oxidation and reduction solutions. In addition, X-ray photoelectron spectroscopy (XPS) has been used as a reference method to establish the various charge states of the Au-NPs resulting from the different treatment steps. After the oxygen-plasma treatment, a shift of the capacitance-voltage (C—V) curve (and flatband potential) of the Au-NP-covered p-Si—SiO2 EIS structure by about -300 mVwas found. The exposure of the EIS sensor surface to an oxidative and a reductive solution resulted in a shift of the C—V curve for —85 and +81 mV, respectively. These observations correlate well with corresponding binding energy shifts in Au 4f core spectra in XPS experiments. The obtained results may open new opportunities for biosensing and biochips based on nanoparticle-charge-gated field-effect devices.
机译：首次使用电容性场效应电解质-绝缘体-半导体（EIS）装置来追踪由氧等离子体处理或由于在水氧化和还原溶液中储存而诱导的负载型金纳米粒子（Au-NPs）的电荷。此外，X射线光电子能谱（XPS）已被用作建立不同处理步骤所产生的Au-NPs各种电荷状态的参考方法。在氧等离子体处理之后，发现Au-NP覆盖的p-Si-SiO2 EIS结构的电容-电压（CV）曲线（和平带电势）偏移了-300 mV。 EIS传感器表面暴露于氧化性和还原性溶液导致CV曲线分别发生了-85和+81 mV的偏移。这些观察结果与XPS实验中Au 4f核心光谱中的相应结合能移动有很好的相关性。获得的结果可能为基于纳米电荷门控场效应器件的生物传感和生物芯片打开新的机遇。

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