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Study of trap structure of thermally polarized polyimide

机译：热极化聚酰亚胺的陷阱结构研究

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摘要

The trap structure of polyimide was studied using open-circuit thermally stimulated discharge current (TSDC). TSDC was observed in 25-μm thin film of polyimide at different condition of polarizing field and temperature. The one-sided vacuum-aluminized samples were used to record the open-circuit thermally stimulated current. The dipolar mechanism of relaxation is a possible mechanism to explain the behavior of TSDC peak at low temperature and field condition; however, hopping transport mechanism is prominent for the sample polarized with higher field and temperature. This is because deeper traps capture the charge carriers at high polarizing field and temperature and their subsequent trapping through hopping process. The influence of surface traps is caused by thermal polarization; it is evident due to lower value of activation energy, since activation energy of TSDC peak is corresponding to surface traps. The morphology of surface traps is verified by measuring the surface roughness using atomic force microscopy. The both type of charges (i.e., heterocharge and homocharge) are responsible for flow of current in presence of air gap. We report the role of surface and deep traps induced due to charging process.
机译：使用开路热激发放电电流（TSDC）研究了聚酰亚胺的陷阱结构。在偏振场和温度不同的条件下，在25μm的聚酰亚胺薄膜中观察到TSDC。单侧真空镀铝样品用于记录开路热激励电流。弛豫的偶极机制是解释TSDC峰值在低温和野外条件下行为的可能机制。但是，对于在较高的场和温度下极化的样品，跳跃传输机制是突出的。这是因为较深的陷阱会在高极化场和高温下捕获电荷载流子，并随后通过跳频过程捕获它们。表面陷阱的影响是由热极化引起的。显然，由于较低的活化能值，因为TSDC峰的活化能对应于表面陷阱。通过使用原子力显微镜测量表面粗糙度来验证表面陷阱的形态。两种类型的电荷（即，杂电荷和均电荷）负责在存在气隙的情况下的电流流动。我们报告了由于充电过程引起的表面和深层陷阱的作用。

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