Surface analysis of bismuth titanate by Auger and X-ray photoelectron spectroscopy

C. Jovalekic; M. Zdujic; Lj. Atanasoska

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Surface analysis of bismuth titanate by Auger and X-ray photoelectron spectroscopy

机译：钛酸铋的俄歇和X射线光电子能谱分析

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The Auger and XPS technique has been used for investigation in the surface of bismuth titanate (Bi_4Ti_3O_(12)) (BIT) ceramics obtained by reactive sintering from Bi_2O_3 and TiO_2 oxides. All peaks characteristic for bismuth, titanium and oxygen are clearly visible in the spectrum. Oxygen vacancies are preferentially sited in the vicinity of bismuth ions observed by our X-ray photoemission data. The variation in the valence state of titanium ions is also possible. The XPS and AES measurements confirm that the surface elemental composition of bismuth titanate ceramics does not deviate from nominal bulk composition.

机译：俄歇（Auger）和XPS技术已用于研究通过反应烧结从Bi_2O_3和TiO_2氧化物获得的钛酸铋（Bi_4Ti_3O_（12））（BIT）陶瓷的表面。铋，钛和氧的所有特征峰在光谱中清晰可见。根据我们的X射线光发射数据观察到，氧空位优先位于铋离子附近。钛离子的价态的变化也是可能的。 XPS和AES测量结果证实，钛酸铋陶瓷的表面元素组成与标称体积组成没有偏差。

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《Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics》 |2009年第2期|共4页
作者
C. Jovalekic; M. Zdujic; Lj. Atanasoska;
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正文语种 eng
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Ferroelectrics; Sintering; Photoelectron spectroscopy;

机译：铁电体;烧结;光电子能谱;

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1. Surface analysis of bismuth titanate by Auger and X-ray photoelectron spectroscopy [J] . C. Jovalekic, M. Zdujic, Lj. Atanasoska Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics . 2009,第1a2期

机译：钛酸铋的俄歇和X射线光电子能谱分析
2. Summary of ISO/TC 201 Standard: XXX. ISO 18516: 2006 - Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution [J] . Wolstenholme J Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films . 2008,第5期

机译：ISO / TC 201标准摘要：XXX。 ISO 18516：2006-表面化学分析-俄歇电子能谱和X射线光电子能谱-横向分辨率的测定
3. Summary of ISO/TC 201 Standard: XXIX. ISO 20903: 2006 - Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results [J] . Powell CJ Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films . 2007,第5期

机译：ISO / TC 201标准摘要：XXIX。 ISO 20903：2006-表面化学分析-俄歇电子能谱和X射线光电子能谱-用于确定峰强度的方法和报告结果时所需的信息
4. Some Issues in Quantitative X-Ray Photoelectron Spectroscopy and Auger-Electron Spectroscopy [C] . C. J. Powell, J. M. Conny, A. Jablonski International Symposium on State-of-the-Art Application of Surface and Interface Analysis Methods to Environmental Material Interactions: in Honor of James E.Castle's 65th Year, Mar 26-27, 2001, Washington D.C. . 2001

机译：定量X射线光电子能谱和俄歇电子能谱中的一些问题
5. Characterization of the electronic and geometric structures of aluminas using X-ray photoelectron spectroscopy, Auger electron spectroscopy, electron energy loss spectroscopy, and low energy electron diffraction. [D] . Kao, Chi-Chang. 1988

机译：使用X射线光电子能谱，俄歇电子能谱，电子能量损失能谱和低能电子衍射来表征氧化铝的电子和几何结构。
6. Effective attenuation lengths for quantitative determination of surface composition by Auger-electron spectroscopy and X-ray photoelectron spectroscopy [O] . A. Jablonski, C. J. Powell -1

机译：通过俄歇电子能谱和X射线光电子能谱定量测定表面成分的有效衰减长度
7. SURFACE REACTIONS AND SURFACE ANALYSIS OF LITHIUM METAL AND ITS COMPOUNDS STUDIED BY AUGER ELECTRON SPECTROSCOPY, X-RAY PHOTOELECTRON SPECTROSCOPY AND RUTHERFORD BACKSCATTERING SPECTROMETRY (THERMAL BATTERIES). [O] . Burrow Bradley James 1984

机译：欧格电子能谱，X射线光电子能谱和拉特福德反散射谱（热电池）研究的锂及其化合物的表面反应和表面分析。

Surface analysis of bismuth titanate by Auger and X-ray photoelectron spectroscopy

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