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首页> 外文期刊>Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics >Temperature dependent dielectric characterization of manganese dioxide nanostructures with different morphologies at low frequency
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Temperature dependent dielectric characterization of manganese dioxide nanostructures with different morphologies at low frequency

机译：低频下不同形态的二氧化锰纳米结构的温度相关介电特性

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摘要

The β-MnO_2 microrods and α-MnO_2 nanowires were prepared with hydrothermal methods at 160 ℃ for 48 h. The effects of the reactant concentrations on the crystal structures and morphologies of the samples were carried out. Analytical methods such as X-ray diffraction (XRD), scanning electron microscopy (FESEM), and transmission electron microscopy (TEM) were employed to characterize the morphology and microstructure of the final products. The temperature dependent of dielectric properties of the samples from 223K to 393K were also characterized and discussed in detail. The results show that the crystal structures and morphologies of the samples change with the KMnO4 concentration from β-MnO_2 pyramidal microrods with diameters 2–3μm and lengths 3–6μm to α-MnO_2 nanowires with 30-nmdiameters and 1-μm-lengths. The dielectric constants and the dielectric loss tangents decrease with the frequency but increase with the temperature. The samples prepared at moderate KMnO_4 concentration,which contains both nanowires and microrods in the systems, show the best dielectric permittivity and loss tangents.
机译：用水热法在160℃加热48h制备β-MnO_2微棒和α-MnO_2纳米线。进行了反应物浓度对样品的晶体结构和形态的影响。使用诸如X射线衍射（XRD），扫描电子显微镜（FESEM）和透射电子显微镜（TEM）的分析方法来表征最终产品的形态和微观结构。还对223K至393K样品的介电性能随温度的变化进行了表征和详细讨论。结果表明，样品的晶体结构和形态随KMnO4浓度的变化而变化，从直径为2–3μm，长度为3–6μm的β-MnO_2锥形微棒到直径为30nm和长度为1μm的α-MnO_2纳米线。介电常数和介电损耗正切随频率降低，但随温度升高。以中等KMnO_4浓度制备的样品（系统中同时包含纳米线和微棒）显示出最佳的介电常数和损耗角正切。

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