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Influence of the various doping elements on the microwave dielectric loss of silica

机译:各种掺杂元素对二氧化硅微波介电损耗的影响

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摘要

This article presents an evaluation of the influence of various doping elements on the dielectric loss of silica glass. Based on the Anderson-Stuart model, the temperature dependence of the electrical conductivity activation energy was investigated; then, comparisons of microwave dielectric loss of silica doped by various elements such as Li_2O, Na_2O, K_2O, CaO, MgO and Al_2O_3 are presented. At 1373 K, the dielectric loss of silica doped with Li_2O was found to be 10 times more than that the undoped one. The order in the impact of the doping elements on the microwave dielectric loss was found to be Li_2O>Na_2O>K_2O>MgO>CaO>Al_2O_3. This work is of importance with regard to applications that employ silica glass at conditions that involve especially high temperature and also in the microwave frequency range.
机译:本文介绍了各种掺杂元素对石英玻璃介电损耗的影响的评估。基于Anderson-Stuart模型,研究了电导活化能的温度依赖性。然后,比较了掺有Li_2O,Na_2O,K_2O,CaO,MgO和Al_2O_3等各种元素的二氧化硅的微波介电损耗。在1373 K处,发现掺有Li_2O的二氧化硅的介电损耗比未掺杂的介电损耗高10倍。发现掺杂元素对微波介电损耗的影响顺序为Li_2O> Na_2O> K_2O> MgO> CaO> Al_2O_3。对于在特别高温和微波频率范围内使用石英玻璃的应用,这项工作非常重要。

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