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Physical properties and characterization of Ag doped CdS thin films

机译:Ag掺杂CdS薄膜的物理性质和表征

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摘要

Thin films of cadmium sulfide with very well defined preferential orientation and relatively high absorption coefficient were fabricated by thermal evaporation technique. The research is focused to the fabrication and characterization of the compositional data of CdS thin films obtained by using X-ray diffraction, scanning electron microscope along with energy dispersive X-ray spectroscopy. The optical properties were studied by using a UV-VIS-NIR spectrophotometer. The effects of silver-doping by ion exchange process on the properties of as-deposited CdS thin films have been investigated.
机译:通过热蒸发技术制备了具有良好定义的优先取向和相对较高吸收系数的硫化镉薄膜。该研究致力于通过X射线衍射,扫描电子显微镜和能量色散X射线光谱学获得的CdS薄膜的成分数据的制备和表征。通过使用UV-VIS-NIR分光光度计研究光学性质。研究了通过离子交换工艺掺杂银对沉积的CdS薄膜性能的影响。

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