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首页> 外文期刊>Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics >Crystal structure and surface morphology of magnetron sputtering deposited hexagonal and perovskite-like YbMnO_3 thin films
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Crystal structure and surface morphology of magnetron sputtering deposited hexagonal and perovskite-like YbMnO_3 thin films

机译：磁控溅射沉积六角形和钙钛矿型YbMnO_3薄膜的晶体结构和表面形态

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摘要

Thin YbMnO_3 films with thickness 50-100 nm were grown by RF-magnetron sputtering on NdGaO_3 (001), SrTiO_3(001), SrTiO3(110), LaAlO_3(001) and on buffer layered Pt(111)/SrTiO_3(111) substrates. X-ray analysis reveals that the platinum buffer layer grown on a single crystalline SrTiO_3(l 11) substrate as well as the hexagonal YbMnO_3 film with c-axis normal to the substrate plane grow epitaxially. The orthorhombic (perovskite-like) modification of YbMnO_3, which otherwise forms in a bulk hexagonal structure, has been epitaxially stabilized on NdGaO_3, SrTiO_3 and LaAlO_3 single crystal substrates. The surface topography of the films was studied by atomic force microscopy. The surface of the hexagonal films reveals spiral-shaped growth terraces with a step height of half the c-lattice parameter. The perov skite-like films have a smooth surface with small 50-100 nm islands. Piezoresponse force microscopy was used to demonstrate the ferroelectric behavior of the hexagonal films. Thin films of a compound with a structure different from the bulk one can also show different physical properties. In the case of multif-erroics it can lead to enhancing of magnetoelectric coupling.
机译：通过RF磁控溅射在NdGaO_3（001），SrTiO_3（001），SrTiO3（110），LaAlO_3（001）和缓冲层Pt（111）/ SrTiO_3（111）衬底上生长厚度为50-100 nm的YbMnO_3薄膜。 X射线分析表明，在单晶SrTiO_3（11）衬底上生长的铂缓冲层以及c轴垂直于衬底平面的六边形YbMnO_3膜均外延生长。 YbMnO_3的正交晶（钙钛矿型）变体（否则以本体六边形结构形成）已在NdGaO_3，SrTiO_3和LaAlO_3单晶衬底上外延稳定。通过原子力显微镜研究膜的表面形貌。六边形薄膜的表面显示出螺旋形的生长阶跃，阶跃高度为c晶格参数的一半。佩罗夫状的类似滑膜的表面光滑，带有50-100 nm的小岛。压电响应显微镜用于证明六角形薄膜的铁电行为。具有不同于本体结构的化合物的薄膜也可以显示不同的物理性质。在多重铁的情况下，它可以导致磁电耦合的增强。

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