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首页> 外文期刊>Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics >Effect of precursor purity and flow rate on the CVD growth of hexagonal boron nitride
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Effect of precursor purity and flow rate on the CVD growth of hexagonal boron nitride

机译:前驱体纯度和流速对六方氮化硼CVD生长的影响

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摘要

Atomically-thin hexagonal boron nitride (h-BN) layers are attractive two-dimensional dielectric material for nanoelectronic devices. However, it has been a challenge to reproducibly synthesize continuous and high quality single layer h-BN. Herein, we report the effect of precursor flow rate and impurities on the synthesis of h-BN layers using a chemical vapor deposition (CVD) method. It was shown that the initial flow rate of precursor significantly impacts the nucleation density. In addition, even minute amount of carbon impurities could significantly degrade the quality of the product. (C) 2016 Elsevier B.V. All rights reserved.
机译:原子薄六方氮化硼(h-BN)层是用于纳米电子器件的有吸引力的二维介电材料。然而,可重复地合成连续且高质量的单层h-BN一直是一个挑战。在本文中,我们报告了前体流速和杂质对使用化学气相沉积(CVD)方法合成h-BN层的影响。结果表明,前驱体的初始流速显着影响成核密度。另外,即使微量的碳杂质也可能显着降低产品质量。 (C)2016 Elsevier B.V.保留所有权利。

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