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Enhanced energy storage density and its variation tendency in CaZrxTi1-xO3 ceramics

机译:CaZrxTi1-xO3陶瓷中增强的储能密度及其变化趋势

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摘要

The improved energy storage density and its variation tendency have been investigated for CaZrxTi1-xO3 (x = 0.0, 0.1, 0.2, 0.3, 0.4, 0.5) solid solution ceramics. The dense ceramics with high bulk density above 97% could be obtained, and X-ray diffraction analysis confirms the orthorhombic single phase structure in all compositions. Substitution of Zr4+ obviously increases the sintering temperature, and the homogeneous fine grain structure is obtained. With increasing x, the dielectric constant er decreases from 175 to 103, while the dielectric strength E-b increases from 435 kV/cm to 756 kV/cm. The highest energy storage density of 2.7 J/cm(3) is achieved at x = 0.4, which is much higher than that of CaTiO3 end-member. The energy storage density significantly increases with decreasing the thickness due to the increased dielectric strength (For the samples with x = 0.5, the dielectric strength increases from 584 kV/cm to 756 kV/cm while the energy storage density increases from 1.6 J/cm(3) to 2.6 J/cm(3) when the thickness changes from 0.50 mm to 0.15 mm). (C) 2016 Published by Elsevier B.V.
机译:对于CaZrxTi1-xO3(x = 0.0、0.1、0.2、0.3、0.4、0.5)固溶陶瓷,已经研究了提高的储能密度及其变化趋势。可以得到具有高于97%的高堆积密度的致密陶瓷,并且X射线衍射分析证实了所有组成中的正交单相结构。 Zr4 +的取代明显提高了烧结温度,并获得了均匀的细晶粒结构。随着x的增加,介电常数er从175降低到103,而介电强度E-b从435 kV / cm增加到756 kV / cm。在x = 0.4时,可以达到2.7 J / cm(3)的最高能量存储密度,这比CaTiO3端部件的能量存储密度高得多。由于介电强度的增加,能量存储密度随着厚度的减小而显着增加(对于x = 0.5的样品,介电强度从584 kV / cm增加到756 kV / cm,而能量存储密度从1.6 J / cm增加(3)当厚度从0.50 mm变为0.15 mm时为2.6 J / cm(3)。 (C)2016由Elsevier B.V.发布

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