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Short-range order evolution in S-rich Ge-S glasses by X-ray photoelectron spectroscopy

机译:X射线光电子能谱分析富S的Ge-S眼镜的短程有序演化

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摘要

The structure of binary Ge_xS_(100 - x) chalcogenide glasses (10 < x < 30) is determined by high-resolution X-ray photoelectron spectroscopy (XPS). On the basis of compositional dependence of fitting parameters for Ge and S core level XPS spectra, the ratio between edge- and corner-shared tetrahedra is determined. It is shown that short-range order of these glasses includes fragments of high-temperature crystalline form of GeS_2. When subjected to X-irradiation, the structure of investigated glasses appears to become more homogeneous than that of the as-prepared samples.
机译:通过高分辨率X射线光电子能谱(XPS)确定二元Ge_xS_(100-x)硫族化物玻璃(10

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