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首页> 外文期刊>Journal of Physics, D. Applied Physics: A Europhysics Journal >Oxygen vacancy induced phase formation and room temperature ferromagnetism in undoped and Co-doped TiO _2 thin films
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Oxygen vacancy induced phase formation and room temperature ferromagnetism in undoped and Co-doped TiO _2 thin films

机译：未掺杂和共掺杂的TiO _2薄膜中的氧空位诱导相形成和室温铁磁性

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摘要

TiO _2 and Co-doped TiO _2 (CTO) thin films deposited at various oxygen partial pressures by pulsed laser deposition exhibit room temperature ferromagnetism (RTFM) independent of their phase. Films deposited at 0.1mTorr oxygen partial pressure show a complete rutile phase confirmed from glancing angle x-ray diffraction and Raman spectroscopy. At the highest oxygen partial pressure, i.e. 300mTorr, although the TiO _2 film shows a complete anatase phase, a small peak corresponding to the rutile phase along with the anatase phase is identified in the case of CTO film. An increase in O to Ti/(Ti+Co) ratio with increase in oxygen partial pressure is observed from Rutherford backscattering spectroscopy. It is revealed from x-ray photoelectron spectroscopy (XPS) that oxygen vacancies are found to be higher in the CTO film than TiO _2, while the valency of cobalt remains in the +2 state. Therefore, the CTO film deposited at 300mTorr does not show a complete anatase phase unlike the TiO _2 film deposited at the same partial pressure. We conclude that RTFM in both films is not due to impurities/contaminants, as confirmed from XPS depth profiling and cross-sectional transmission electron microscopy (TEM), but due to oxygen vacancies. The magnitude of moment, however, depends not only on the phase of TiO _2 but also on the crystallinity of the films.
机译：通过脉冲激光沉积在各种氧分压下沉积的TiO _2和Co掺杂的TiO _2（CTO）薄膜表现出独立于其相的室温铁磁（RTFM）。通过掠射角X射线衍射和拉曼光谱证实，在0.1mTorr的氧气分压下沉积的薄膜显示出完整的金红石相。在最高的氧分压下，即300mTorr，尽管TiO _2膜显示出完全的锐钛矿相，但是在CTO膜的情况下，发现了与金红石相以及锐钛矿相对应的小峰。从卢瑟福反向散射光谱观察到，O与Ti /（Ti + Co）之比随氧分压的增加而增加。从X射线光电子能谱（XPS）揭示，发现CTO膜中的氧空位比TiO _2高，而钴的化合价保持在+2状态。因此，与在相同分压下沉积的TiO _2膜不同，以300mTorr沉积的CTO膜没有显示完整的锐钛矿相。我们得出的结论是，正如XPS深度分析和横截面透射电子显微镜（TEM）所证实的那样，两种膜中的RTFM都不是由于杂质/污染物引起的，而是由于氧空位引起的。然而，力矩的大小不仅取决于TiO _2的相，而且取决于膜的结晶度。

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