...
  • 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>Journal of Physics. Condensed Matter >Recent advances in chemical and magnetic imaging of surfaces and interfaces by XPEEM
【24h】

Recent advances in chemical and magnetic imaging of surfaces and interfaces by XPEEM

机译：XPEEM在表面和界面化学和磁性成像方面的最新进展

获取原文
获取原文并翻译 | 示例
           
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

Synchrotron-based photoemission electron microscopy (XPEEM) is one of the most powerful spectro-microscopic techniques for the investigation of surfaces, interfaces, thin films and buried layers. By exploiting the tunability and polarizability of x-ray sources as well as progress in electron optics design, modern XPEEM instruments can perform several x-ray spectroscopic investigations with a lateral resolution of a few tens of nanometres. We review here the latest developments in XPEEM, illustrating the state of the art capabilities of the technique. The usefulness of chemical and magnetic imaging XPEEM methods is demonstrated by examples of fundamental and applied studies in surface and material sciences, as well as other fields of application ranging from magnetism to biology and geology.
机译：基于同步加速器的光发射电子显微镜（XPEEM）是研究表面，界面，薄膜和埋层的最强大的光谱显微镜技术之一。通过利用X射线源的可调性和极化性以及电子光学设计的进步，现代XPEEM仪器可以执行数十个纳米分辨率的X射线光谱研究。我们在这里回顾XPEEM的最新发展，说明该技术的最新功能。化学和磁成像XPEEM方法的有用性通过表面和材料科学以及从磁性到生物学和地质学等其他应用领域的基础研究和应用研究的实例得以证明。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号