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Mechanical exfoliation and layer number identification of single crystal monoclinic CrCl3

机译：机械剥离和单晶单斜晶类CRCL3的层数鉴定

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摘要

After the recent finding that CrI3, displays ferromagnetic order down to its monolayer, extensive studies have followed to pursue new two-dimensional (2D) magnetic materials. In this article, we report on the growth of single crystal CrCl(3)in the layered monoclinic phase. The system after mechanical exfoliation exhibits stability in ambient air (the degradation occurs on a time scale at least four orders of magnitude longer than is observed for CrI3). By means of mechanical cleavage and atomic force microscopy (AFM) combined with optical identification, we demonstrate the systematic isolation of single and few layer flakes onto 270 nm and 285 nm SiO2/Si (100) substrates with lateral size larger than graphene flakes isolated with the same method. The layer number identification has been carried with statistically significant data, quantifying the optical contrast as a function of the number of layers for up to six layers. Layer dependent optical contrast data have been fitted within the Fresnel equation formalism determining the real and imaginary part of the wavelength dependent refractive index of the material. A layer dependent (532 nm) micro-Raman study has been carried out down to two layers with no detectable spectral shifts as a function of the layer number and with respect to the bulk.
机译：在最近发现CRI3后，将铁磁顺序显示为其单层，广泛的研究遵循新的二维（2D）磁性材料。在本文中，我们报告了层状单晶相中单晶CRCl（3）的生长。机械剥离后的系统在环境空气中表现出稳定性（在时间尺度上发生降解至少四个数量级，比对于CRI3）。通过机械裂解和原子力显微镜（AFM）结合光学识别，我们证明了单个和少数层薄片的系统分离到270nm和285nm SiO 2 / Si（100）基材上，横向尺寸大于与石墨烯剥落分离的横向尺寸相同的方法。已经在具有统计上有明显的数据的层号识别，作为最多六层的层数的函数量化光学对比度。层依赖性光学对比度数据已经装配在菲涅耳方程式形式中，确定材料的波长依赖性折射率的真实和虚部。层依赖于层（532nm）微拉曼研究已经下降到两层，没有可检测的光谱移位作为层数和相对于散装的函数。

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