Cleaved thin-film probes for scanning tunneling microscopy

Siahaan T.; Kurnosikov O.; Barcones B.; Swagten H. J. M.; Koopmans B.

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Cleaved thin-film probes for scanning tunneling microscopy

机译：用于扫描隧道显微镜的切割薄膜探针

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We introduce an alternative type of probe for scanning tunneling microscopy (STM). Instead of using a needle-like tip made from a piece of metallic wire, a sharp-edged cleaved insulating substrate, which is initially covered by a thin conductive film, is used. The sharp tip is formed at the intersection of the two cleaved sides. Using this approach a variety of materials for STM probes can be used, and functionalization of STM probes is possible. The working principle of different probes made of metallic (Pt, Co, and CoB), indium-tin oxide, as well as Cu/Pt and Co/Pt multilayer films are demonstrated by STM imaging of clean Cu(001) and Cu(111) surfaces as well as the epitaxial Co clusters on Cu(111).

机译：我们介绍一种替代类型的探头，用于扫描隧道显微镜（STM）。不使用由一块金属线制成的针状尖端，而不是使用最初被薄导电膜覆盖的尖锐的切割绝缘基板。尖锐的尖端形成在两个切割侧面的交叉处。使用这种方法可以使用各种用于STM探针的材料，并且可以使用STM探针的功能化。通过清洁Cu（001）和Cu的STM成像证明了由金属（Pt，Co和COB），氧化铟锡以及Cu / Pt和Co / Pt多层膜制成的不同探针的工作原理（111）（111 ）表面以及Cu（111）上的外延Co簇。

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来源
《Nanotechnology》 |2016年第3期|共6页
作者
Siahaan T.; Kurnosikov O.; Barcones B.; Swagten H. J. M.; Koopmans B.;
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作者单位

Eindhoven Univ Technol Dept Appl Phys NL-5600 MB Eindhoven Netherlands;

Eindhoven Univ Technol Dept Appl Phys NL-5600 MB Eindhoven Netherlands;

Eindhoven Univ Technol Dept Appl Phys NL-5600 MB Eindhoven Netherlands;

Eindhoven Univ Technol Dept Appl Phys NL-5600 MB Eindhoven Netherlands;

Eindhoven Univ Technol Dept Appl Phys NL-5600 MB Eindhoven Netherlands;

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原文格式 PDF
正文语种 eng
中图分类特种结构材料;
关键词
scanning tuneling microscopy; stm probe; probes fabrication; probes functionalization;

机译：扫描隧道显微镜;STM探头;探针制作;探针功能化;

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专利

1. Cleaved thin-film probes for scanning tunneling microscopy [J] . Siahaan T., Kurnosikov O., Barcones B., Nanotechnology . 2016,第3期

机译：用于扫描隧道显微镜的切割薄膜探针
2. Resistive Switching Mechanisms on TaOx and SrRuO3 Thin-Film Surfaces Probed by Scanning Tunneling Microscopy [J] . Moors Marco, Adepalli Kiran Kumar, Lu Qiyang, ACS nano . 2016,第1期

机译：扫描隧道显微镜在TaOx和SrRuO3薄膜表面上的电阻转换机制
3. Direct Observation of Lanthanide(lll)-Phthalocyanine Molecules on Au(111) by Using Scanning Tunneling Microscopy and Scanning Tunneling Spectroscopy and Thin-Film Field-Effect Transistor Properties of Tb(lll)- and Dy(lll)-Phthalocyanine Molecules [J] . Keiichi Katoh, Yusuke Yoshida, Masahiro Yamashita, Journal of the American Chemical Society . 2009,第29期

机译：使用扫描隧道显微镜和扫描隧道光谱以及Tb（III）-和Dy（III）-酞菁分子的薄膜场效应晶体管特性直接观察Au（111）上的镧系元素（酞菁）-酞菁分子
4. Strong uniaxial anisotropies of iron grown on UHV cleaved lnAs(110) investigated by correlated scanning tunneling microscopy and ferromagnetic resonance [C] . Detlef Spoddig, Christian Urban, Dai-Hyun You Annual Conference on Magnetism and Magnetic Materials . 2005

机译：通过相关扫描隧道显微镜和铁磁共振研究，在UHV切割的LNA（110）上生长的强大单轴各向异性
5. High pressure scanning tunneling microscopy studies of adsorbate structure and mobility during catalytic reactions. Novel design of an ultra high pressure, high temperature scanning tunneling microscope system for probing catalytic conversions. [D] . Tang, David Chi-Wai. 2005

机译：催化反应过程中吸附物结构和迁移率的高压扫描隧道显微镜研究。用于探测催化转化的超高压高温扫描隧道显微镜系统的新颖设计。
6. Insulated gold scanning tunneling microscopy probes for recognition tunneling in an aqueous environment [O] . Michael Tuchband, Jin He, Shuo Huang, -1

机译：绝缘金扫描隧道显微镜探针用于在水性环境中识别隧道
7. Resistive Switching Mechanisms on TaO$_{x}$ and SrRuO$_{3}$ Thin-Film Surfaces Probed by Scanning Tunneling Microscopy [O] . Moors, Marco, Adepalli, Kiran Kumar, Valov, Ilia, 2016

机译：通过扫描隧道显微镜探测TaO $ _ {x} $和SrRuO $ _ {3} $薄膜表面上的电阻转换机制

Cleaved thin-film probes for scanning tunneling microscopy

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