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Investigation on H-containing shallow trap of hydrogenated TiO2 with in situ Fourier transform infrared diffuse reflection spectroscopy

机译：用原位傅里叶变换红外漫射反射光谱研究含H含氢浅捕集的H型浅疏水膜

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摘要

A novel technique, high temperature high pressure in situ Fourier transform infrared diffuse reflection spectroscopy, was successfully used to investigate the formation and stability of shallow trap states in P25 TiO2 nanoparticles. Two types of shallow traps (with and without H atoms) were identified. The H-containing shallow trap can be easily generated by heating in H-2 atmosphere. However, the trap is unstable in vacuum at 600 degrees C. In contrast, the H-free shallow trap, which can be formed by heating in vacuum, is stable even at 600 degrees C. The energy gaps between shallow trap states and the conduction band are 0.09 eV for H-containing shallow trap and 0.13 eV for H-free shallow trap, indicating that the H-containing shallow trap state is closer to the conduction band than that without H.
机译：一种新型技术，高温高压原位傅里叶变换红外漫射反射光谱，用于研究P25 TiO2纳米颗粒中浅陷阱状态的形成和稳定性。 鉴定了两种类型的浅疏水阀（有没有H原子）。 通过在H-2气氛中加热，可以容易地产生含H含阱的浅疏水阀。 然而，捕集器在600℃下真空不稳定。相反，可以通过真空加热形成的无H浅捕集器，即使在600℃下也稳定。浅陷阱状态和传导之间的能量间隙 频段为0.09eV，适用于含H浅陷阱的0.13eV，对于无HL无浅陷阱，表示含H的浅陷阱状态更靠近导带而不是没有H的传导。

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