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Epitaxial graphene growth on FIB patterned 3C-SiC nanostructures on Si (111): reducing milling damage

机译:在Si(111)上的FIB图案化3C-SiC纳米结构上的外延石墨烯生长:减少碾磨损伤

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摘要

Epitaxial growth of graphene on SiC is a scalable procedure that does not require any further transfer step, making this an ideal platform for graphene nanostructure fabrication. Focused ion beam (FIB) is a very promising tool for exploring the reduction of the lateral dimension of graphene on SiC to the nanometre scale. However, exposure of graphene to the Ga+ beam causes significant surface damage through amorphisation and contamination, preventing epitaxial graphene growth. In this paper we demonstrate that combining a protective silicon layer with FIB patterning implemented prior to graphene growth can significantly reduce the damage associated with FIB milling. Using this approach, we successfully achieved graphene growth over 3C-SiC/Si FIB patterned nanostructures.
机译:SiC上石墨烯的外延生长是一种不需要进一步转移步骤的可扩展程序,使得这是石墨烯纳米结构制造的理想平台。 聚焦离子束(FIB)是一种非常有前途的工具,用于探索石墨烯的横向尺寸对纳米级的横向尺寸。 然而,石墨烯对Ga +光束的暴露通过无制和污染,防止外延石墨烯生长引起显着的表面损伤。 在本文中,我们证明将保护性硅层与石墨烯生长之前实施的FIB图案相结合,可以显着降低与FIB铣削相关的损伤。 使用这种方法,我们通过3C-SiC / Si Fib图案化纳米结构成功实现了石墨烯生长。

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