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Phase imaging and nanoscale energy dissipation of supported graphene using amplitude modulation atomic force microscopy

机译：使用幅度调制原子力显微镜的相成像和纳米级能量耗散支持的石墨烯

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摘要

We investigate the phase imaging of supported graphene using amplitude modulation atomic force microscopy (AFM), the so-called tapping mode. The phase contrast between graphene and the neighboring substrate grows in hard tapping conditions and the contrast is enhanced compared to the topographic one. Therefore, phase measurements could enable the high-contrast imaging of graphene and related two-dimensional materials and heterostructures, which is not achievable with conventional AFM based topographic measurements. Obtained phase maps are then transformed into energy dissipation maps, which are important for graphene applications in various nano-mechanical systems. From a fundamental point of view, energy dissipation gives further insight into mechanical properties. Reliable measurements, obtained in the repulsive regime, show that the energy dissipation on a graphene-covered substrate is lower than that on a bare one, so graphene provides certain shielding in tip-substrate interaction. Based on the obtained phase curves and their derivatives, as well as on correlation measurements based on AFM nanoindentation and force modulation microscopy, we conclude that the main dissipation channels in graphene-substrate systems are short-range hysteresis and long-range interfacial forces.
机译：我们研究支持石墨烯的相位成像使用幅度调制原子力显微镜（AFM），所谓的攻丝模式。石墨烯与相邻基板之间的相位对比度在硬攻攻条件中生长，与地形相比，增强了对比度。因此，相位测量可以使得石墨烯和相关二维材料和异质结构的高对比度成像，其与传统的基于AFM的地形测量不可实现。然后将获得的相位图转化为能量耗散图，这对于各种纳米机械系统中的石墨烯应用很重要。从基本的角度来看，能量耗散进一步了解机械性能。在排斥制度中获得的可靠测量表明，石墨烯覆盖的基板上的能量耗散低于裸露的基板上的能量耗散，因此石墨烯在尖端基板相互作用中提供某些屏蔽。基于所获得的相曲线及其衍生物，以及基于AFM纳米内狭窄和力调制显微镜的相关测量，我们得出结论，石墨烯 - 衬底系统中的主要耗散通道是短程滞后和远程界面力。

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